详细介绍
特性和优点
P6248
1.7 GHz(典型探头仅 ≤27℃)1X 模式
1.5 GHz 带宽(保证)
1.85 GHz(典型探头仅 ≤27℃)10X 模式
P6247
>1.0 GHz 带宽(保证)
P6246
400 MHz 带宽(保证)
常规
低输入电容:
探头输入连接器:两个标准 0.025 英寸/0.63 毫米(中心 0.1 英寸)方针插座(孔型)
静电放电容限 (IEC 801-2)
使用 1103 TekProbe®电源连接至 TDS 系列示波器或其他仪器的 TekProbe®BNC 接口
适用于示波器、频谱分析仪或网络分析器
>60 dB (1000:1) 共模抑制比 (CMRR)
探头顶部较小,易于探测 SMD
应用
通信(千兆以太网、IEEE-1394、光纤通道)
半导体特点描述 (RAMBUS)
磁盘驱动器读取通道设计
通信脉冲形状一致性
抖动、串扰和 BERT 测量
跳地效应定位
P6246、P6247 和 P6248 差分探头
P6248、P6247 和 P6246 使用户可以在磁盘驱动器、数字 IC 设计 (RAMBUS) 和通信应用(千兆以太网、IEEE-1394 Firewire 和光纤通道)通常涉及的高带宽信号上进行时域或频域测量。P6248 拥有允许 RAMBUS 进行探测和 IEEE-1394 互联访问的附件。较小的几何形探头头部和各式各样的探头端部附件使这些探头在维持高共模抑制比的情况下,轻松实现表面组装器件的手动探测。
P6246、P6247 和 P6248 非常适用于磁盘驱动器读取、通道电子装置的设计验证以及解决与高速逻辑相关的跳地效应问题时的定时分析。它们还可用于高速通信信号的脉冲形状或串扰的一致性测试。
Features and benefits
P6248
1.7 GHz (typical probe only 27 ℃ or less) 1 x model
1.5ghz bandwidth (guaranteed)
1.85 GHz (typical probe only 27 ℃) or less 10 x model
P6247
>1.0 GHz bandwidth (guaranteed)
P6246
400 MHz bandwidth (guaranteed)
conventional
Low input capacitance:
Probe input connector: two standard 0.025in / 0.63mm (center 0.1in) policy sockets (hole)
Electrostatic discharge capacitance limit (IEC 801-2)
Use 1103 TekProbe ® power connections to the TDS series oscilloscope or other instruments TekProbe ® BNC interface
Suitable for oscilloscope, spectrum analyzer or network analyzer
>60 dB (1000:1) common mode rejection ratio (CMRR)
The probe has a small top and is easy to detect SMD
application
Communication (gigabit Ethernet, ieee-1394, fiber channel)
Description of semiconductor characteristics (RAMBUS)
Disk drive read channel design
Communication pulse shape consistency
Jitter, crosstalk, and BERT measurements
Jumping effect location
P6246, P6247 and P6248 difference probes
P6248, P6247, and P6246 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals typically involved in disk drives, digital IC design (RAMBUS), and communications applications (gigabit Ethernet, ieee-1394 Firewire, and fiber channel).P6248 has attachments that allow RAMBUS to probe and ieee-1394 interconnect.Small geometry probe heads and a variety of probe end attachments enable these probes to easily perform manual detection of surface assembly devices while maintaining a high CMRR.
P6246, P6247 and P6248 are very suitable for disk drive reading, design verification of channel electronic devices and timing analysis when solving the jumping effect problems related to high-speed logic.They can also be used for conformance testing of pulse shape or crosstalk of high-speed communication signals.